Reflectance sampling module for contactless measurements
with extended focus, QuickSnap

The reflectance sampling module enables a contactless FT-IR-analysis in front of the ALPHA-spectrometer. The extended focus and a slim measuring adapter allows the surface analysis of shaped samples.
The ALPHA QuickSnap sampling modules offer complete sampling flexibility. All modules are easily exchanged without the use of tools and then automatically recognized by the ALPHA FT-IR spectrometer.

Specifications:
– Spectral range: 350-8000 cm-1
– Long and slim measuring adapter
– Measurement spot: ca. 7mm diameter
– Measurement distance from spectrometer front: ca. 42mm
– Angle of incidence: 11°
– Including reference mirror
– Easy exchange of ALPHA Quick Snap sampling modules with automatic recognition, performance test and automatic load of measurement parameters.

Required: ALPHA base spectrometer (A250/Dx) or FT-IR microscope LUMOS with macro unit (A773/LM)